Structured Illumination Microscope (SIM) enables multicolor volumetric imaging of fixed and live specimens with sub-diffraction resolution in all dimensions.
The image is reconstructed in Fourier Space from images taken under structured illumination generating Moire patterns.
DaMBIC's Nikon SIM microscope is equipped with a high-speed structured illumination system, that allows acquisition speeds up to 15 fps (512 x 512 pixels, 2 msec exposure) thereby being able to capture fast dynamic processes at twice the spatial resolution compared to conventional light microscopes (wavelength-dependent resolution is down to ~85–120 nm in x, y and ~300 nm in z, depending on the illumination and SIM-mode).
SIM-modes: TIRF-SIM, 2D-SIM, 3D-SIM (slice or stack reconstruction).
A dual-camera setup allows simultaneous two-channel imaging. Cameras are ORCA-Flash 4.0 sCMOS camera (Hamamatsu). Field of view is 66 µm x 66 µm.
The LU-NV laser unit contains the following lasers: 405 nm, 488 nm, 561 nm, 640 nm.
The Nikon N-SIM is build onto a Ti-2 LFOV microscope body available with the following objectives: 100x Oil, 100x Si, 40x.
NB. operating conditions are restricted to 20-28°C (+/- 1.5°C) i.e. temperature fluctuations are not tolerated well.
The microscope PC is installed with Nikon NIS-Elements that is also used on other DaMBIC microscopes allowing easy familiarization with the user environment across the different microscopes.
Overview of the Nikon super resolution microscopes (SIM and STORM).