Nikon N-SIM


Structured Illumination Microscope (SIM) enables multicolor volumetric imaging of fixed and live specimens with sub-diffraction resolution in all dimensions.

The image is reconstructed in Fourier Space from images taken under structured illumination generating Moire patterns.

DaMBIC's Nikon SIM microscope is equipped with a high-speed structured illumination system, that allows acquisition speeds up to 15 fps (512 x 512 pixels, 2 msec exposure) thereby being able to capture fast dynamic processes at twice the spatial resolution compared to conventional light microscopes (wavelength-dependent resolution is down to ~85–120 nm in x, y and ~300 nm in z, depending on the illumination and SIM-mode).

SIM-modes: TIRF-SIM, 2D-SIM, 3D-SIM (slice or stack reconstruction).

A dual-camera setup allows simultaneous two-channel imaging. Cameras are ORCA-Flash 4.0 sCMOS camera (Hamamatsu). Field of view is 66 µm x 66 µm.

The LU-NV laser unit contains the following lasers: 405 nm, 488 nm, 561 nm, 640 nm.

The Nikon N-SIM is build onto a Ti-2 LFOV microscope body available with the following objectives: 100x Oil, 100x Si, 40x.

NB. operating conditions are restricted to 20-28°C (+/- 1.5°C) i.e. temperature fluctuations are not tolerated well.

The microscope PC is installed with Nikon NIS-Elements that is also used on other DaMBIC microscopes allowing easy familiarization with the user environment across the different microscopes.

Overview of the Nikon super resolution microscopes (SIM and STORM).

Location: V11-601b-0