JPK Atomic force microscope

Atomic force microscope JPK’s NanoWizard I provides a stable platform for high resolution imaging and force measurement at variable temperature (up to 50°C). The instrument allows microscopy in liquids and in air. The AFM head is mounted on Nikon TE2000-U Eclipce inverted microscope, which has UV, blue, green and red filter sets and a pco-sensicam camera for image acquisition.  

The Nanowizard I is especially well suited for the in-situ measurement of biological samples, but also can be used to study surface morphology of solid-state samples.